Advanced probe-card inspection, verification, and repair solutions designed to support precision, reliability, and performance in semiconductor wafer testing.
In partnership with BE Precision Technology
Lightwell Technologies provides advanced probe-card analysis, inspection, and repair solutions in partnership with BE Precision Technology, a specialist in precision testing and diagnostic equipment for the semiconductor industry.
Probe-card performance plays a critical role in semiconductor wafer testing, where accurate probe alignment, reliable electrical contact, and consistent measurement results are essential to maintaining test quality and production yield.
Lightwell offers a comprehensive range of probe-card testing and diagnostic systems developed by BE Precision Technology to support different inspection requirements, probe-card configurations, and semiconductor testing applications.
Reliable probe-card verification and performance characterization
The Supervisor V is an advanced probe-card verification system designed to evaluate the integrity and performance of probe-card assemblies before they are used in semiconductor wafer testing.
Equipped with comprehensive measurement and analytical capabilities, the system helps manufacturers verify probe-card readiness, identify potential performance issues, and maintain consistent testing conditions.
Supervisor V also supports Statistical Process Control (SPC) characterization before and after wafer sorting, enabling engineers to analyze probe-card performance trends and investigate their relationship with test yield.
Comprehensive 3D inspection for accurate probe-card evaluation
Inspector is a precision inspection system designed to provide detailed three-dimensional visualization and analysis of probe-card assemblies.
The system displays the complete probe-card area in 3D and utilizes reference data containing probe-position information and inspection requirements, allowing engineers to perform structured and consistent probe-head evaluations.
Inspector supports a wide range of probe-card technologies, including MEMS, cantilever, vertical, and membrane probe-cards, making it suitable for diverse semiconductor testing environments.
Developed as both a verification and investigation tool, Inspector helps identify probe-card abnormalities, evaluate assembly integrity, and confirm readiness for safe and reliable testing.
Integrated electrical, mechanical, and repair capabilities
Manager IV combines probe-card analysis, electrical measurement, and repair functionality in a single system to support comprehensive probe-card maintenance and verification.
In addition to probe alignment and planarity measurement, the system evaluates contact resistance, including ultra-low resistance, and compares results against stored reference data.
Manager IV also supports probe-tip cleaning and sanding, enabling technicians to perform corrective maintenance and repeat contact-resistance testing.
Its electrical testing capabilities include selectable leakage testing modes and optional analysis of bussed probes, while contact-force measurement functions support the evaluation of individual probe characteristics.
High-capacity analysis for next-generation semiconductor testing
Manager V is a high-performance probe-card analyzer and repair system developed to meet the increasing complexity of modern semiconductor testing applications.
As probe-cards evolve toward higher pin counts, greater probe density, and larger testing arrays, accurate inspection and effective repair become increasingly important for maintaining performance and managing equipment costs.
Designed by BE Precision Technology, Manager V supports advanced probe-card analysis with a testing capacity of up to 88,000 channels and compatibility with full-wafer-contact probe-cards up to 450 mm.
The system incorporates high-performance mechanical components, including a large diamond viewing window, a rigid carbon flip-table, and a powerful Z-axis stage, to support demanding inspection and measurement requirements.
Extend Equipment Performance Without Complete Replacement
BE Precision Technology’s PRVX upgrade offers a modernization option for compatible existing probe-card analysis equipment. It is designed to improve motion control, measurement precision and automation capabilities, extending equipment performance without complete replacement.
Lightwell works with customers to review their existing equipment configuration and testing requirements, then coordinates with BE Precision Technology to assess upgrade suitability.
BE Precision Technology’s probe-card analysis solutions are designed to support a broad range of semiconductor manufacturing and testing requirements, including:
Verification of probe-card readiness and performance before wafer-sort operations.
Inspection and validation of probe-card assemblies during manufacturing and quality control.
Identification of performance abnormalities and support for corrective maintenance.
Analysis of complex, high-density, and large-format probe-card configurations.
Measurement characterization and performance evaluation to support consistent testing processes.
Lightwell works with customers to understand their probe-card technologies, testing requirements, and production objectives before coordinating suitable equipment recommendations.
Looking to improve probe-card inspection accuracy, testing reliability, or equipment performance?
Contact Lightwell Technologies to discuss your probe-card analysis and verification requirements. Our team can help identify suitable solutions from BE Precision Technology’s product range based on your semiconductor testing applications.